Precise Os isotope ratio and Re–Os isotope dilution measurements down to the picogram level using multicollector inductively coupled plasma mass spectrometry

Schoenberg, Ronny; Nägler, Thomas F.; Kramers, Jan D. (2000). Precise Os isotope ratio and Re–Os isotope dilution measurements down to the picogram level using multicollector inductively coupled plasma mass spectrometry. International journal of mass spectrometry, 197(1-3), pp. 85-94. Elsevier 10.1016/S1387-3806(99)00215-8

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Item Type:	Journal Article (Original Article)
Division/Institute:	08 Faculty of Science > Institute of Geological Sciences
UniBE Contributor:	Nägler, Frank Thomas, Kramers, Jan Dirk
Subjects:	500 Science > 550 Earth sciences & geology
ISSN:	1387-3806
Publisher:	Elsevier
Language:	English
Submitter:	Anja Ebeling
Date Deposited:	19 Sep 2016 15:40
Last Modified:	11 Apr 2024 16:12
Publisher DOI:	10.1016/S1387-3806(99)00215-8
URI:	https://boris.unibe.ch/id/eprint/88549