JExample: Exploiting Dependencies Between Tests to Improve Defect Localization

Kuhn, Adrian; Rompaey, Bart Van; Haensenberger, Lea; Nierstrasz, Oscar Marius; Demeyer, Serge; Gaelli, Markus; Leemput, Koenraad Van (2008). JExample: Exploiting Dependencies Between Tests to Improve Defect Localization. In: Abrahamsson, Pekka; Baskerville, Richard; Conboy, Kieran; Fitzgerald, Brian; Morgan, Lorraine; Wang, Xiaofeng (eds.) Agile Processes in Software Engineering and Extreme Programming. 9th International Conference, XP 2008, Limerick, Ireland, June 10-14, 2008. Proceedings. Lecture Notes in Business Information Processing: Vol. 9 (pp. 73-82). Heidelberg: Springer Verlag 10.1007/978-3-540-68255-4_8

Text Seiten aus 10.1007_978-3-540-68255-4-1.pdf - Published Version Restricted to registered users only Available under License Publisher holds Copyright. Download (216kB) | Request a copy

To quickly localize defects, we want our attention to be focussed on relevant failing tests. We propose to improve defect localization by exploiting dependencies between tests, using a JUnit extension called JExample. In a case study, a monolithic white-box test suite for a complex algorithm is refactored into two traditional JUnit style tests and to JExample. Of the three refactorings, JExample reports five times fewer defect locations and slightly better performance (-8-12\%), while having similar maintenance characteristics. Compared to the original implementation, JExample greatly improves maintainability due the improved factorization following the accepted test quality guidelines. As such, JExample combines the benefits of test chains with test quality aspects of JUnit style testing.

Interest & Impact

Downloads

0 since deposited on 04 Oct 2013
0 in the past 12 months

Citations

5 Citations in Web of Science ®
6 Citations in Scopus

Search

in Google Scholar™

Services

Actions (login required)

Edit item

Actions (login required)

Edit item