Testing the radiation hardness of thick-film resistors for a time-of-flight mass spectrometer at jupiter with 18 MeV protons

Lasi, Davide; Tulej, Marek; Neuland, Maike Brigitte; Wurz, Peter; Carzaniga, Tommaso Stefano; Nesteruk, Konrad Pawel; Braccini, Saverio; Elsener, H. R. (2017). Testing the radiation hardness of thick-film resistors for a time-of-flight mass spectrometer at jupiter with 18 MeV protons. Radiation effects data workshop (REDW), pp. 1-9. IEEE 10.1109/nsrec.2017.8115474

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The Neutral and Ion Mass Spectrometer onboard ESA Jupiter mission JUICE employs thick-film resistors (from ~1 Ω to ~1 MΩ), screen-printed on ceramic elements, to realize high-voltage ion optical elements and decontamination heaters. Despite the relevant space heritage, these materials were never employed before in a radiation environment comparable to Jupiter’s magnetosphere. With this study, we prove the suitability of these materials for the NIM instrument by means of irradiation up to ~ 16–85 Mrad in vacuum with 18 MeV protons. To allow an accurate calculation of the dose, the chemical composition of the samples is determined by Laser Mass Spectrometry. Thanks to a custom-designed irradiation station, the temperature and the electrical parameters of the sample are monitored in real-time during the irradiation, or the sample can be subject to high-voltages representative of the operating conditions in space. All in all, the materials proved to be radiation-hard in the investigated dose range, with few exceptions where permanent damages occur.

Item Type:

Journal Article (Original Article)

Division/Institute:

10 Strategic Research Centers > Albert Einstein Center for Fundamental Physics (AEC)
08 Faculty of Science > Physics Institute > Laboratory for High Energy Physics (LHEP)
08 Faculty of Science > Physics Institute
08 Faculty of Science > Physics Institute > Space Research and Planetary Sciences

UniBE Contributor:

Lasi, Davide; Tulej, Marek; Neuland, Maike Brigitte; Wurz, Peter; Carzaniga, Tommaso Stefano; Nesteruk, Konrad Pawel and Braccini, Saverio

Subjects:

500 Science > 530 Physics
500 Science > 520 Astronomy
600 Technology > 620 Engineering

ISSN:

2154-0535

ISBN:

978-1-5090-4647-8

Publisher:

IEEE

Language:

English

Submitter:

Dora Ursula Zimmerer

Date Deposited:

26 Mar 2018 08:56

Last Modified:

26 Mar 2018 08:56

Publisher DOI:

10.1109/nsrec.2017.8115474

BORIS DOI:

10.7892/boris.107769

URI:

https://boris.unibe.ch/id/eprint/107769

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