Schroder, Arne; Murk, Axel; Wylde, Richard; Schobert, Dennis; Winser, Mike (2017). Brightness Temperature Computation of Microwave Calibration Targets. IEEE transactions on geoscience and remote sensing, 55(12), pp. 7104-7112. Institute of Electrical and Electronics Engineers IEEE 10.1109/TGRS.2017.2740559
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A rigorous numerical technique to compute the brightness temperature of arbitrarily shaped microwave calibration targets is presented. The proposed method allows the brightness temperature of calibration targets to be investigated depending on frequency, absorber material, geometry, antenna pattern, field incidence, and temperature environment. We have validated the accuracy and studied the numerical complexity of the approach by means of analytical reference solutions. Fundamental brightness temperature investigations of pyramid absorbers are shown for various thermal environments in different frequency bands between 20 and 450 GHz. Based on these analyses, a novel pyramid geometry was designed, which features a superior electromagnetic and thermal performance compared with conventional pyramid designs. Using the theoretical findings, we have developed reduced-order models of pyramid targets for rapid brightness temperature studies.
Item Type: |
Journal Article (Original Article) |
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Division/Institute: |
08 Faculty of Science > Institute of Applied Physics 08 Faculty of Science > Institute of Applied Physics > Microwaves |
UniBE Contributor: |
Murk, Axel |
Subjects: |
600 Technology > 620 Engineering 500 Science > 530 Physics |
ISSN: |
0196-2892 |
Publisher: |
Institute of Electrical and Electronics Engineers IEEE |
Language: |
English |
Submitter: |
Simone Corry |
Date Deposited: |
15 Jun 2018 09:18 |
Last Modified: |
05 Dec 2022 15:12 |
Publisher DOI: |
10.1109/TGRS.2017.2740559 |
BORIS DOI: |
10.7892/boris.114725 |
URI: |
https://boris.unibe.ch/id/eprint/114725 |