Single-shot electron bunch length measurements using a spatial electro-optical autocorrelation interferometer

Sütterlin, Daniel; Erni, Daniel; Schlott, Volker; Sigg, Hans; Jäckel, Heinz; Murk, Axel (2010). Single-shot electron bunch length measurements using a spatial electro-optical autocorrelation interferometer. Review of scientific instruments, 81(10), p. 104702. Woodbury, N.Y.: American Institute of Physics 10.1063/1.3480997

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A spatial, electro-optical autocorrelation (EOA) interferometer using the vertically polarized lobes of coherent transition radiation (CTR) has been developed as a single-shot electron bunch length monitor at an optical beam port downstream the 100 MeV preinjector LINAC of the Swiss Light Source. This EOA monitor combines the advantages of step-scan interferometers (high temporal resolution) [D. Mihalcea et al., Phys. Rev. ST Accel. Beams 9, 082801 (2006) and T. Takahashi and K. Takami, Infrared Phys. Technol. 51, 363 (2008)] and terahertz-gating technologies [U. Schmidhammer et al., Appl. Phys. B: Lasers Opt. 94, 95 (2009) and B. Steffen et al., Phys. Rev. ST Accel. Beams 12, 032802 (2009)] (fast response), providing the possibility to tune the accelerator with an online bunch length diagnostics. While a proof of principle of the spatial interferometer was achieved by step-scan measurements with far-infrared detectors, the single-shot capability of the monitor has been demonstrated by electro-optical correlation of the spatial CTR interference pattern with fairly long (500 ps) neodymium-doped yttrium aluminum garnet (Nd:YAG) laser pulses in a ZnTe crystal. In single-shot operation, variations of the bunch length between 1.5 and 4 ps due to different phase settings of the LINAC bunching cavities have been measured with subpicosecond time resolution.

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Journal Article (Original Article)


04 Faculty of Medicine > Department of Orthopaedic, Plastic and Hand Surgery (DOPH) > Clinic of Plastic and Hand Surgery > Plastic, Reconstructive and Aesthetic Surgery
08 Faculty of Science > Institute of Applied Physics

UniBE Contributor:

Erni, Dominique, Murk, Axel




American Institute of Physics




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Date Deposited:

04 Oct 2013 14:10

Last Modified:

05 Dec 2022 14:01

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URI: (FactScience: 202641)

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