Grabowsky, Simon; Luger, Peter; Buschmann, Jürgen; Schneider, Thomas; Schirmeister, Tanja; Sobolev, Alexandre N.; Jayatilaka, Dylan (2012). The Significance of Ionic Bonding in Sulfur Dioxide: Bond Orders from X-ray Diffraction Data. Angewandte Chemie (International ed.), 51(27), pp. 6776-6779. Wiley-VCH 10.1002/anie.201200745
![[img]](https://boris.unibe.ch/style/images/fileicons/text.png) |
Text
019_Grabowsky2012_AngewChemIntEd.pdf - Published Version Restricted to registered users only Available under License Publisher holds Copyright. Download (1MB) |
A novel refinement technique for X‐ray diffraction data has been employed to derive S-O bond orders in sulfur dioxide experimentally. The results show that ionic S-O bonding dominates over hypervalency.
Item Type: |
Journal Article (Original Article) |
|---|---|
Division/Institute: |
08 Faculty of Science > Department of Chemistry, Biochemistry and Pharmaceutical Sciences (DCBP) |
UniBE Contributor: |
Grabowsky, Simon |
Subjects: |
500 Science > 570 Life sciences; biology 500 Science > 540 Chemistry |
ISSN: |
1433-7851 |
Publisher: |
Wiley-VCH |
Language: |
English |
Submitter: |
Simon Grabowsky |
Date Deposited: |
05 Feb 2020 16:43 |
Last Modified: |
05 Dec 2022 15:35 |
Publisher DOI: |
10.1002/anie.201200745 |
BORIS DOI: |
10.7892/boris.138483 |
URI: |
https://boris.unibe.ch/id/eprint/138483 |
Actions (login required)
 |
Edit item |