Nonlinear XUV-optical transient grating spectroscopy at the Si L 2,3 –edge

Bohinc, R.; Pamfilidis, G.; Rehault, J.; Radi, P.; Milne, C.; Szlachetko, J.; Bencivenga, F.; Capotondi, F.; Cucini, R.; Foglia, L.; Masciovecchio, C.; Mincigrucci, R.; Pedersoli, E.; Simoncig, A.; Mahne, N.; Cannizzo, A.; Frey, H. M.; Ollmann, Z.; Feurer, T.; Maznev, A. A.; ... (2019). Nonlinear XUV-optical transient grating spectroscopy at the Si L 2,3 –edge. Applied physics letters, 114(18), p. 181101. American Institute of Physics 10.1063/1.5085413

[img] Text
1.5085413.pdf - Published Version
Restricted to registered users only
Available under License Publisher holds Copyright.

Download (1MB) | Request a copy

Item Type:

Journal Article (Original Article)

Division/Institute:

08 Faculty of Science > Institute of Applied Physics
08 Faculty of Science > Institute of Applied Physics > Lasers

UniBE Contributor:

Cannizzo, Andrea; Frey, Hans-Martin and Feurer, Thomas

Subjects:

600 Technology > 620 Engineering
500 Science
500 Science > 530 Physics

ISSN:

0003-6951

Publisher:

American Institute of Physics

Language:

English

Submitter:

Simone Corry

Date Deposited:

09 Jun 2021 15:59

Last Modified:

09 Jun 2021 16:06

Publisher DOI:

10.1063/1.5085413

BORIS DOI:

10.48350/156749

URI:

https://boris.unibe.ch/id/eprint/156749

Actions (login required)

Edit item Edit item
Provide Feedback