Riedo, Andreas; Ruosch, Michael; Frenz, Martin; Scheer, Jürgen A.; Wurz, Peter (2012). On the surface characterization of an Al2O3 charge state conversion surface using ion scattering and atomic force microscope measurements. Applied surface science, 258(19), pp. 7292-7298. Amsterdam: North-Holland 10.1016/j.apsusc.2012.03.139
Full text not available from this repository. (Request a copy)Item Type: |
Journal Article (Original Article) |
|---|---|
Division/Institute: |
08 Faculty of Science > Physics Institute 08 Faculty of Science > Institute of Applied Physics |
UniBE Contributor: |
Riedo, Andreas, Frenz, Martin, Scheer, Jürgen, Wurz, Peter |
ISSN: |
0169-4332 |
Publisher: |
North-Holland |
Language: |
English |
Submitter: |
Factscience Import |
Date Deposited: |
04 Oct 2013 14:43 |
Last Modified: |
05 Dec 2022 14:13 |
Publisher DOI: |
10.1016/j.apsusc.2012.03.139 |
Web of Science ID: |
000304254000008 |
URI: |
https://boris.unibe.ch/id/eprint/17910 (FactScience: 225747) |
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