On the surface characterization of an Al2O3 charge state conversion surface using ion scattering and atomic force microscope measurements

Riedo, Andreas; Ruosch, Michael; Frenz, Martin; Scheer, Jürgen A.; Wurz, Peter (2012). On the surface characterization of an Al2O3 charge state conversion surface using ion scattering and atomic force microscope measurements. Applied surface science, 258(19), pp. 7292-7298. Amsterdam: North-Holland 10.1016/j.apsusc.2012.03.139

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Item Type:

Journal Article (Original Article)

Division/Institute:

08 Faculty of Science > Physics Institute
08 Faculty of Science > Institute of Applied Physics

UniBE Contributor:

Riedo, Andreas; Frenz, Martin; Scheer, Jürgen and Wurz, Peter

ISSN:

0169-4332

Publisher:

North-Holland

Language:

English

Submitter:

Factscience Import

Date Deposited:

04 Oct 2013 14:43

Last Modified:

06 Dec 2013 13:40

Publisher DOI:

10.1016/j.apsusc.2012.03.139

Web of Science ID:

000304254000008

URI:

https://boris.unibe.ch/id/eprint/17910 (FactScience: 225747)

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