Elemental analysis with x-ray fluorescence spectrometry

Lienemann, Peter; Bleiner, Davide (2012). Elemental analysis with x-ray fluorescence spectrometry. In: Bleiner, Davide (ed.) Short-Wavelength Imaging and Spectroscopy Sources. Proceedings of SPIE: Vol. 8678 (86780D). Bellingham: SPIE 10.1117/12.2010944

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Item Type:	Conference or Workshop Item (Paper)
Division/Institute:	08 Faculty of Science > Institute of Applied Physics
UniBE Contributor:	Bleiner, Davide
Series:	Proceedings of SPIE
Publisher:	SPIE
Language:	English
Submitter:	Factscience Import
Date Deposited:	04 Oct 2013 14:43
Last Modified:	05 Dec 2022 14:13
Publisher DOI:	10.1117/12.2010944
URI:	https://boris.unibe.ch/id/eprint/17933 (FactScience: 225770)