Elemental analysis with x-ray fluorescence spectrometry

Lienemann, Peter; Bleiner, Davide (2012). Elemental analysis with x-ray fluorescence spectrometry. In: Bleiner, Davide (ed.) Short-Wavelength Imaging and Spectroscopy Sources. Proceedings of SPIE: Vol. 8678 (86780D). Bellingham: SPIE 10.1117/12.2010944

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Item Type:

Conference or Workshop Item (Paper)

Division/Institute:

08 Faculty of Science > Institute of Applied Physics

UniBE Contributor:

Bleiner, Davide

Series:

Proceedings of SPIE

Publisher:

SPIE

Language:

English

Submitter:

Factscience Import

Date Deposited:

04 Oct 2013 14:43

Last Modified:

08 Jun 2016 10:36

Publisher DOI:

10.1117/12.2010944

URI:

https://boris.unibe.ch/id/eprint/17933 (FactScience: 225770)

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