Micro-scale structural and chemical characterisation of deformed rocks with simultaneous in-situ synchrotron X-ray fluorescence and backscatter diffraction mapping

Schrank, C.E.; Jones, M.W.M.; Howard, D.L.; Berger, A.; Herwegh, M. (2024). Micro-scale structural and chemical characterisation of deformed rocks with simultaneous in-situ synchrotron X-ray fluorescence and backscatter diffraction mapping. Chemical geology, 645, p. 121886. Elsevier 10.1016/j.chemgeo.2023.121886

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Item Type:

Journal Article (Original Article)

Division/Institute:

08 Faculty of Science > Institute of Geological Sciences

UniBE Contributor:

Berger, Alfons, Herwegh, Marco

Subjects:

500 Science > 550 Earth sciences & geology

ISSN:

0009-2541

Publisher:

Elsevier

Language:

English

Submitter:

Marco Herwegh

Date Deposited:

21 Dec 2023 07:16

Last Modified:

14 Jan 2024 02:42

Publisher DOI:

10.1016/j.chemgeo.2023.121886

BORIS DOI:

10.48350/190444

URI:

https://boris.unibe.ch/id/eprint/190444

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