Safety of Active Implantable Devices during MRI Examinations: A Finite Element Analysis of an Implantable Pump

Büchler, Philippe; Simon, Anne; Burger, Jürgen; Ginggen, Alec; Crivelli, Rocco; Tardy, Yanik; Luechinger, Roger; Olsen, Sigbjorn (2007). Safety of Active Implantable Devices during MRI Examinations: A Finite Element Analysis of an Implantable Pump. IEEE transactions on biomedical engineering, 54(4), pp. 726-733. New York, N.Y.: Institute of Electrical and Electronics Engineers IEEE 10.1109/TBME.2006.890145

[img]
Preview
Text
04132925.pdf - Published Version
Available under License Publisher holds Copyright.
© 2007 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Download (983kB) | Preview

The goal of this study was to propose a general numerical analysis methodology to evaluate the magnetic resonance imaging (MRI)-safety of active implants. Numerical models based on the finite element (FE) technique were used to estimate if the normal operation of an active device was altered during MRI imaging. An active implanted pump was chosen to illustrate the method. A set of controlled experiments were proposed and performed to validate the numerical model. The calculated induced voltages in the important electronic components of the device showed dependence with the MRI field strength. For the MRI radiofrequency fields, significant induced voltages of up to 20 V were calculated for a 0.3T field-strength MRI. For the 1.5 and 3.0T MRIs, the calculated voltages were insignificant. On the other hand, induced voltages up to 11 V were calculated in the critical electronic components for the 3.0T MRI due to the gradient fields. Values obtained in this work reflect to the worst case situation which is virtually impossible to achieve in normal scanning situations. Since the calculated voltages may be removed by appropriate protection circuits, no critical problems affecting the normal operation of the pump were identified. This study showed that the proposed methodology helps the identification of the possible incompatibilities between active implants and MR imaging, and can be used to aid the design of critical electronic systems to ensure MRI-safety

Item Type:

Journal Article (Original Article)

Division/Institute:

04 Faculty of Medicine > Pre-clinic Human Medicine > Institute for Surgical Technology & Biomechanics ISTB

UniBE Contributor:

Büchler, Philippe; Burger, Jürgen and Olsen, Sigbjorn

Subjects:

500 Science > 570 Life sciences; biology
600 Technology > 610 Medicine & health

ISSN:

0018-9294

ISBN:

726-733

Publisher:

Institute of Electrical and Electronics Engineers IEEE

Language:

English

Submitter:

Factscience Import

Date Deposited:

04 Oct 2013 14:57

Last Modified:

13 Dec 2014 13:43

Publisher DOI:

10.1109/TBME.2006.890145

PubMed ID:

17405380

Web of Science ID:

000245191500016

BORIS DOI:

10.7892/boris.24167

URI:

https://boris.unibe.ch/id/eprint/24167 (FactScience: 47388)

Actions (login required)

Edit item Edit item
Provide Feedback