Nanoscale switching characteristics of nearly tetragonal BiFeO3 thin films

Mazumdar, Dipanjan; Shelke, Vilas; Iliev, Milko; Jesse, Stephen; Kumar, Amit; Kalinin, Sergei V; Baddorf, Arthur P; Gupta, Arunava (2010). Nanoscale switching characteristics of nearly tetragonal BiFeO3 thin films. Nano letters, 10(7), pp. 2555-61. Washington, D.C.: American Chemical Society 10.1021/nl101187a

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We have investigated the nanoscale switching properties of strain-engineered BiFeO(3) thin films deposited on LaAlO(3) substrates using a combination of scanning probe techniques. Polarized Raman spectral analysis indicates that the nearly tetragonal films have monoclinic (Cc) rather than P4mm tetragonal symmetry. Through local switching-spectroscopy measurements and piezoresponse force microscopy, we provide clear evidence of ferroelectric switching of the tetragonal phase, but the polarization direction, and therefore its switching, deviates strongly from the expected (001) tetragonal axis. We also demonstrate a large and reversible, electrically driven structural phase transition from the tetragonal to the rhombohedral polymorph in this material, which is promising for a plethora of applications.

Item Type:

Journal Article (Original Article)

Division/Institute:

04 Faculty of Medicine > Department of Head Organs and Neurology (DKNS) > Clinic of Ophthalmology

UniBE Contributor:

Iliev, Milko Emilov

ISSN:

1530-6984

Publisher:

American Chemical Society

Language:

English

Submitter:

Factscience Import

Date Deposited:

04 Oct 2013 14:12

Last Modified:

17 Mar 2015 19:15

Publisher DOI:

10.1021/nl101187a

PubMed ID:

20586433

Web of Science ID:

000280416200044

URI:

https://boris.unibe.ch/id/eprint/2655 (FactScience: 205500)

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