Pham, Thanh Duc; Keller, Hubert; Breuer, Stefan; Huemann, Sascha; Hai, Nguyen Minh; Zoerlein, Caroline; Wandelt, Klaus; Broekmann, Peter (2009). Anion/Cation layers at Electrified Interfaces: A Comprehensive STM, XRD, and XPS Case Study. CHIMIA, 63(3), pp. 115-121. Bern: Schweizerische Chemische Gesellschaft 10.2533/chimia.2009.115
Full text not available from this repository.Item Type: |
Journal Article (Original Article) |
---|---|
Division/Institute: |
08 Faculty of Science > Department of Chemistry, Biochemistry and Pharmaceutical Sciences (DCBP) |
UniBE Contributor: |
Broekmann, Peter |
ISSN: |
0009-4293 |
Publisher: |
Schweizerische Chemische Gesellschaft |
Language: |
English |
Submitter: |
Factscience Import |
Date Deposited: |
04 Oct 2013 15:20 |
Last Modified: |
05 Dec 2022 14:24 |
Publisher DOI: |
10.2533/chimia.2009.115 |
Web of Science ID: |
000264870400004 |
URI: |
https://boris.unibe.ch/id/eprint/36059 (FactScience: 203181) |