Anion/Cation layers at Electrified Interfaces: A Comprehensive STM, XRD, and XPS Case Study

Pham, Thanh Duc; Keller, Hubert; Breuer, Stefan; Huemann, Sascha; Hai, Nguyen Minh; Zoerlein, Caroline; Wandelt, Klaus; Broekmann, Peter (2009). Anion/Cation layers at Electrified Interfaces: A Comprehensive STM, XRD, and XPS Case Study. CHIMIA, 63(3), pp. 115-121. Bern: Schweizerische Chemische Gesellschaft 10.2533/chimia.2009.115

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Item Type:

Journal Article (Original Article)

Division/Institute:

08 Faculty of Science > Departement of Chemistry and Biochemistry

UniBE Contributor:

Broekmann, Peter

ISSN:

0009-4293

Publisher:

Schweizerische Chemische Gesellschaft

Language:

English

Submitter:

Factscience Import

Date Deposited:

04 Oct 2013 15:20

Last Modified:

06 Dec 2013 14:03

Publisher DOI:

10.2533/chimia.2009.115

Web of Science ID:

000264870400004

URI:

https://boris.unibe.ch/id/eprint/36059 (FactScience: 203181)

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