Surface relaxation phenomena at electrified interfaces: revealing adsorbate, potential and solvent effects by combined x-ray diffraction, STM and DFT studies

Saracino, Martino; Broekmann, Peter; Gentz, Knut; Becker, Moritz; Keller, Hubert; Janetzko, Florian; Bredow, Thomas; Wandelt, Klaus; Dosch, Helmut (2009). Surface relaxation phenomena at electrified interfaces: revealing adsorbate, potential and solvent effects by combined x-ray diffraction, STM and DFT studies. Physical review. B - condensed matter and materials physics, 79(11), p. 115448. Ridge, N.Y.: American Physical Society 10.1103/PhysRevB.79.115448

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Item Type:

Journal Article (Original Article)

Division/Institute:

08 Faculty of Science > Departement of Chemistry and Biochemistry

UniBE Contributor:

Broekmann, Peter

ISSN:

1098-0121

Publisher:

American Physical Society

Language:

English

Submitter:

Factscience Import

Date Deposited:

04 Oct 2013 15:20

Last Modified:

17 Mar 2015 22:44

Publisher DOI:

10.1103/PhysRevB.79.115448

Web of Science ID:

000264768900155

URI:

https://boris.unibe.ch/id/eprint/36060 (FactScience: 203182)

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