Shkabko, A.; Aguirre, M.H.; Marozau, I.; Lippert, T.; Weidenkaff, A.
(2009).
Measurements of current-induced heating in an Al/SrTiO3-xNy/Al memristor during electroformation and resistance switching.
Applied physics letters, 59(15), p. 152109.
Melville, N.Y.: American Institute of Physics
10.1063/1.3238563
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Item Type: |
Journal Article
(Original Article)
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Division/Institute: |
08 Faculty of Science > Department of Chemistry, Biochemistry and Pharmaceutical Sciences (DCBP) |
UniBE Contributor: |
Weidenkaff, Anke |
ISSN: |
0003-6951 |
Publisher: |
American Institute of Physics |
Language: |
English |
Submitter: |
Factscience Import
|
Date Deposited: |
04 Oct 2013 15:20 |
Last Modified: |
05 Dec 2022 14:24 |
Publisher DOI: |
10.1063/1.3238563 |
Web of Science ID: |
000270915700040 |
URI: |
https://boris.unibe.ch/id/eprint/36129 (FactScience: 203523) |
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