Measurements of current-induced heating in an Al/SrTiO3-xNy/Al memristor during electroformation and resistance switching

Shkabko, A.; Aguirre, M.H.; Marozau, I.; Lippert, T.; Weidenkaff, A. (2009). Measurements of current-induced heating in an Al/SrTiO3-xNy/Al memristor during electroformation and resistance switching. Applied physics letters, 59(15), p. 152109. Melville, N.Y.: American Institute of Physics 10.1063/1.3238563

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Item Type:

Journal Article (Original Article)

Division/Institute:

08 Faculty of Science > Department of Chemistry, Biochemistry and Pharmaceutical Sciences (DCBP)

UniBE Contributor:

Weidenkaff, Anke

ISSN:

0003-6951

Publisher:

American Institute of Physics

Language:

English

Submitter:

Factscience Import

Date Deposited:

04 Oct 2013 15:20

Last Modified:

06 Dec 2013 14:04

Publisher DOI:

10.1063/1.3238563

Web of Science ID:

000270915700040

URI:

https://boris.unibe.ch/id/eprint/36129 (FactScience: 203523)

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