JExample: Exploiting Dependencies Between Tests to Improve Defect Localization

Kuhn, Adrian; Rompaey, Bart Van; Haensenberger, Lea; Nierstrasz, Oscar Marius; Demeyer, Serge; Gaelli, Markus; Leemput, Koenraad Van (2008). JExample: Exploiting Dependencies Between Tests to Improve Defect Localization. In: Abrahamsson, Pekka; Baskerville, Richard; Conboy, Kieran; Fitzgerald, Brian; Morgan, Lorraine; Wang, Xiaofeng (eds.) Agile Processes in Software Engineering and Extreme Programming. 9th International Conference, XP 2008, Limerick, Ireland, June 10-14, 2008. Proceedings. Lecture Notes in Business Information Processing: Vol. 9 (pp. 73-82). Heidelberg: Springer Verlag 10.1007/978-3-540-68255-4_8

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To quickly localize defects, we want our attention to be focussed on relevant failing tests. We propose to improve defect localization by exploiting dependencies between tests, using a JUnit extension called JExample. In a case study, a monolithic white-box test suite for a complex algorithm is refactored into two traditional JUnit style tests and to JExample. Of the three refactorings, JExample reports five times fewer defect locations and slightly better performance (-8-12\%), while having similar maintenance characteristics. Compared to the original implementation, JExample greatly improves maintainability due the improved factorization following the accepted test quality guidelines. As such, JExample combines the benefits of test chains with test quality aspects of JUnit style testing.

Item Type:

Book Section (Book Chapter)


08 Faculty of Science > Institute of Computer Science (INF)
08 Faculty of Science > Institute of Computer Science (INF) > Software Composition Group (SCG) [discontinued]

UniBE Contributor:

Kuhn, Adrian, Nierstrasz, Oscar


000 Computer science, knowledge & systems




Lecture Notes in Business Information Processing


Springer Verlag




Factscience Import

Date Deposited:

04 Oct 2013 15:22

Last Modified:

02 Mar 2023 23:23

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URI: (FactScience: 206979)

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