Physical characterization of high AMR debris by optical reflectance spectrometry

Schildknecht, T.; Vananti, A.; Krag, H.; Erd, Ch. (2010). Physical characterization of high AMR debris by optical reflectance spectrometry. In: Proceedings of 61st International Astronautical Congress. Astronautical Congress. International.: Vol. 61. International Astronautical Federation ( IAF )

[img] Text
TS_IAC2010.pdf - Published Version
Restricted to registered users only
Available under License Publisher holds Copyright.

Download (113kB) | Request a copy

Item Type:

Conference or Workshop Item (Paper)

Division/Institute:

08 Faculty of Science > Institute of Astronomy

UniBE Contributor:

Schildknecht, Thomas, Vananti, Alessandro

ISBN:

9781617823688

Series:

Astronautical Congress. International.

Publisher:

International Astronautical Federation ( IAF )

Language:

English

Submitter:

Factscience Import

Date Deposited:

04 Oct 2013 14:16

Last Modified:

05 Dec 2022 14:04

BORIS DOI:

10.7892/boris.4585

URI:

https://boris.unibe.ch/id/eprint/4585 (FactScience: 209065)

Actions (login required)

Edit item Edit item
Provide Feedback