Physical characterization of high AMR debris by optical reflectance spectrometry

Schildknecht, T.; Vananti, A.; Krag, H.; Erd, Ch. (2010). Physical characterization of high AMR debris by optical reflectance spectrometry. In: Proceedings of 61st International Astronautical Congress. Astronautical Congress. International.: Vol. 61. International Astronautical Federation ( IAF )

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Item Type:

Conference or Workshop Item (Paper)

Division/Institute:

08 Faculty of Science > Institute of Astronomy

UniBE Contributor:

Schildknecht, Thomas and Vananti, Alessandro

ISBN:

9781617823688

Series:

Astronautical Congress. International.

Publisher:

International Astronautical Federation ( IAF )

Language:

English

Submitter:

Factscience Import

Date Deposited:

04 Oct 2013 14:16

Last Modified:

20 Sep 2016 15:47

BORIS DOI:

10.7892/boris.4585

URI:

https://boris.unibe.ch/id/eprint/4585 (FactScience: 209065)

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