Schwank, Mike; Völksch, Ingo; Wigneron, Jean-Pierre; Kerr, Yann H.; Mialon, Arnaud; de Rosnay, Patricia; Mätzler, Christian (2010). Comparison of two surface reflectivity models and validation with radiometer measurements. IEEE transactions on geoscience and remote sensing, 48(1), pp. 325-337. New York, N.Y.: Institute of Electrical and Electronics Engineers IEEE 10.1109/tgrs.2009.2026894
Full text not available from this repository.Item Type: |
Journal Article (Original Article) |
---|---|
Division/Institute: |
08 Faculty of Science > Institute of Applied Physics |
UniBE Contributor: |
Mätzler, Christian |
ISSN: |
0196-2892 |
Publisher: |
Institute of Electrical and Electronics Engineers IEEE |
Language: |
English |
Submitter: |
Factscience Import |
Date Deposited: |
04 Oct 2013 14:17 |
Last Modified: |
05 Dec 2022 14:04 |
Publisher DOI: |
10.1109/tgrs.2009.2026894 |
Web of Science ID: |
000272998300003 |
URI: |
https://boris.unibe.ch/id/eprint/4894 (FactScience: 209543) |