Comparison of two surface reflectivity models and validation with radiometer measurements

Schwank, Mike; Völksch, Ingo; Wigneron, Jean-Pierre; Kerr, Yann H.; Mialon, Arnaud; de Rosnay, Patricia; Mätzler, Christian (2010). Comparison of two surface reflectivity models and validation with radiometer measurements. IEEE transactions on geoscience and remote sensing, 48(1), pp. 325-337. New York, N.Y.: Institute of Electrical and Electronics Engineers IEEE 10.1109/tgrs.2009.2026894

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Item Type:

Journal Article (Original Article)

Division/Institute:

08 Faculty of Science > Institute of Applied Physics

UniBE Contributor:

Mätzler, Christian

ISSN:

0196-2892

Publisher:

Institute of Electrical and Electronics Engineers IEEE

Language:

English

Submitter:

Factscience Import

Date Deposited:

04 Oct 2013 14:17

Last Modified:

06 Dec 2013 13:25

Publisher DOI:

10.1109/tgrs.2009.2026894

Web of Science ID:

000272998300003

URI:

https://boris.unibe.ch/id/eprint/4894 (FactScience: 209543)

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