Direct measurement of Ar diffusion profiles in a gem-quality Madagascar K-feldspar using the ultra-violet laser ablation microprobe (UVLAMP)

Wartho, Jo-Anne; Kelley, Simon P.; Brooker, Richard A.; Carroll, Mike R.; Villa, Igor Maria; Lee, Martin R. (1999). Direct measurement of Ar diffusion profiles in a gem-quality Madagascar K-feldspar using the ultra-violet laser ablation microprobe (UVLAMP). Earth and planetary science letters, 170(1-2), pp. 141-153. Elsevier 10.1016/S0012-821X(99)00088-6

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Item Type:

Journal Article (Original Article)

Division/Institute:

08 Faculty of Science > Institute of Geological Sciences

UniBE Contributor:

Villa, Igor Maria

Subjects:

500 Science > 550 Earth sciences & geology

ISSN:

0012-821X

Publisher:

Elsevier

Language:

English

Submitter:

Manuela Bamert

Date Deposited:

31 Oct 2016 15:53

Last Modified:

11 Sep 2017 20:30

Publisher DOI:

10.1016/S0012-821X(99)00088-6

BORIS DOI:

10.7892/boris.89736

URI:

https://boris.unibe.ch/id/eprint/89736

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