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Heyse, Bjorn; Proost, Johannes H; Schumacher, Peter M; Bouillon, Thomas W; Vereecke, Hugo E M; Eleveld, Douglas J; Luginbühl, Martin; Struys, Michel M R F (2012). Sevoflurane remifentanil interaction: comparison of different response surface models. Anesthesiology, 116(2), pp. 311-23. Hagerstown, Md.: Lippincott Williams & Wilkins 10.1097/ALN.0b013e318242a2ec
Luginbühl, Martin; Schumacher, Peter M; Vuilleumier, Pascal; Vereecke, Hugo; Heyse, Björn; Bouillon, Thomas W; Struys, Michel M R F (2010). Noxious stimulation response index: a novel anesthetic state index based on hypnotic-opioid interaction. Anesthesiology, 112(4), pp. 872-80. Hagerstown, Md.: Lippincott Williams & Wilkins 10.1097/ALN.0b013e3181d40368
Schumacher, Peter M; Dossche, Jan; Mortier, Eric P; Luginbuehl, Martin; Bouillon, Thomas W; Struys, Michel M R F (2009). Response surface modeling of the interaction between propofol and sevoflurane. Anesthesiology, 111(4), pp. 790-804. Hagerstown, Md.: Lippincott Williams & Wilkins 10.1097/ALN.0b013e3181b799ef
Caruso, Antonello L G; Bouillon, Thomas W; Schumacher, Peter M; Morari, Manfred (2008). On the modeling of drug induced respiratory depression in the non-steady-state. IEEE Engineering in Medicine and Biology Society conference proceedings, 2008, pp. 5564-5568. Piscataway, N.J.: IEEE Service Center 10.1109/IEMBS.2008.4650475
Caruso, Antonello L G; Bouillon, Thomas W; Schumacher, Peter M; Luginbuhl, Martin; Morari, Manfred (2007). Drug-induced respiratory depression: an integrated model of drug effects on the hypercapnic and hypoxic drive. Clinical lymphoma & myeloma, 2007, pp. 4259-4263. Dallas, Tex.: Cancer Information Group 10.1109/IEMBS.2007.4353277
Stadler, Konrad S; Schumacher, Peter M; Hirter, Sibylle; Leibundgut, Daniel; Bouillon, Thomas W; Glattfelder, Adolf H; Zbinden, Alex M (2006). Control of muscle relaxation during anesthesia: a novel approach for clinical routine. IEEE transactions on biomedical engineering, 53(3), pp. 387-98. New York, N.Y.: Institute of Electrical and Electronics Engineers IEEE 10.1109/TBME.2005.869649
