Hurst, G. S.

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Journal Article

Lehmann, B. E.; Loosli, H. H.; Oeschger, Hans; Rauber, Dominique; Hurst, G. S.; Allman, S. L.; Chen, C. H.; Kramer, S. D.; Thonnard, Norbert; Willis, R. D. (1986). Laser resonance ionization mass spectrometry for krypton-81 analysis. Radiocarbon, 28(2A), pp. 223-228. Arizona Board of Regents, University of Arizona 10.1017/S0033822200007311

Hurst, G. S.; Payne, M. G.; Kramer, S. D.; Chen, C. H.; Phillips, R. C.; Allman, S. L.; Alton, G. D.; Dabbs, J. W. T.; Willis, R. D.; Lehmann, B. E. (1985). Method for counting noble gas atoms with isotopic selectivity. Reports on progress in physics, 48(10), pp. 1333-1370. IOP Publishing 10.1088/0034-4885/48/10/001

Lehmann, B. E.; Oeschger, H.; Loosli, H. H.; Hurst, G. S.; Allman, S. L.; Chen, C. H.; Kramer, S. D.; Payne, M. G.; Phillips, R. C.; Willis, R. D.; Thonnard, N. (1985). Counting 81Kr atoms for analysis of groundwater. Journal of Geophysical Research: Solid Earth, 90(B13), pp. 11547-11551. American Geophysical Union 10.1029/JB090iB13p11547

Hurst, G. S.; Payne, M. G.; Phillips, R. C.; Dabbs, J. W. T.; Lehmann, B. E. (1984). Development of an atom buncher. Journal of applied physics, 55(5), pp. 1278-1284. American Institute of Physics 10.1063/1.333216

Kramer, Steven D.; Chen, C. H.; Payne, M. G.; Hurst, G. S.; Lehmann, B. E. (1983). Tunable VUV light generation for the low-level resonant ionization detection of krypton. Applied optics, 22(20), pp. 3271-3275. Optical Society of America 10.1364/AO.22.003271

Book Section

Kramer, S. D.; Chen, C. H.; Payne, M. G.; Hurst, G. S.; Lehmann, B. E.; Willis, R. D. (1983). Two photon resonant, four-wave mixing in xenon-argon gas mixtures. In: Weber, H. P.; Lüthy, W. (eds.) Laser Spectroscopy VI. Springer series in optical sciences: Vol. 40 (p. 392). Springer

Lehmann, B. E.; Hurst, G. S.; Chen, C. H.; Kramer, S. D.; Payne, M. G.; Willis, R. D. (1983). A pulsed laser ionization source for an ultrasensitive noble gas mass spectrometer. In: Weber, H. P.; Lüthy, W. (eds.) Laser Spectroscopy VI. Springer series in optical sciences: Vol. 40. Springer

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