Jenni, Simon

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Conference or Workshop Item

Jenni, Simon; Favaro, Paolo (September 2018). Deep Bilevel Learning. In: European Conference on Computer Vision 2018. Munich, Germany. Sep. 8 - Sep. 14, 2018.

Jenni, Simon; Favaro, Paolo (June 2018). Self-Supervised Feature Learning by Learning to Spot Artifacts. In: 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition. Salt Lake City, Utah, United States. June 18 - June 22, 2018.

This list was generated on Sat Aug 24 17:38:42 2019 CEST.
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