Lanni, F.

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Journal Article

Benoit, M.; Braccini, Saverio; Casse, G.; Chen, H.; Chen, K.; Di Bello, F.A.; Ferrere, D.; Golling, T.; Gonzales-Seviglia, S.; Jacobucci, G.; Kiehn, M.; Lanni, F.; Liu, H.; Meng, L.; Merlassino, Claudia; Miucci, Antonio; Muenstermann, D.; Nessi, M.; Okawa, H.; Peric, I.; ... (2018). Testbeam results of irradiated ams H18 HV-CMOS pixel sensor prototypes. Journal of instrumentation, 13(02), P02011-P02011. Institute of Physics Publishing IOP 10.1088/1748-0221/13/02/P02011

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