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Marin Carbonne, Johanna; Kiss, Andras; Bouvier, Anne-Sophie; Meibom, Anders; Baumgartner, Lukas; Bovay, Thomas; Plane, Florent; Escrig, Stephane; Rubatto, Daniela (2022). Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories. CHIMIA, 76(1-2), p. 26. Schweizerische Chemische Gesellschaft 10.2533/chimia.2022.26
