Towards the analytical modeling of backscattering polarimetric patterns recorded from multiply scattering systems (Conference Presentation)

Akarçay, Hidayet Günhan; Hornung, Manes; Jain, Arushi; Frenz, Martin (4 March 2019). Towards the analytical modeling of backscattering polarimetric patterns recorded from multiply scattering systems (Conference Presentation). In: Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVI. Proc. SPIE: Vol. 10883 (p. 17). SPIE 10.1117/12.2509366

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Item Type:

Conference or Workshop Item (Paper)

Division/Institute:

08 Faculty of Science > Institute of Applied Physics
10 Strategic Research Centers > Albert Einstein Center for Fundamental Physics (AEC)
08 Faculty of Science > Institute of Theoretical Physics
08 Faculty of Science > Institute of Applied Physics > Biomedical Photonics

UniBE Contributor:

Akarçay, Hidayet Günhan; Hornung, Manes; Jain, Arushi and Frenz, Martin

Subjects:

600 Technology > 620 Engineering
500 Science > 530 Physics
500 Science

ISBN:

9781510624092

Series:

Proc. SPIE

Publisher:

SPIE

Language:

English

Submitter:

Simone Corry

Date Deposited:

09 Jun 2021 16:18

Last Modified:

13 Jun 2021 03:10

Publisher DOI:

10.1117/12.2509366

URI:

https://boris.unibe.ch/id/eprint/156809

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