Dependence of Microwave Brightness Temperature on Bistatic Scattering: Theoretical Basis

Mätzler, Christian; Rosenkranz, Philip W (2007). Dependence of Microwave Brightness Temperature on Bistatic Scattering: Theoretical Basis. IEEE transactions on geoscience and remote sensing, 45(7), pp. 2130-2138. New York, N.Y.: Institute of Electrical and Electronics Engineers IEEE 10.1109/TGRS.2007.898089

Full text not available from this repository.

Item Type:

Journal Article (Original Article)

Division/Institute:

08 Faculty of Science > Institute of Applied Physics

UniBE Contributor:

Mätzler, Christian

ISSN:

0196-2892

Publisher:

Institute of Electrical and Electronics Engineers IEEE

Language:

English

Submitter:

Factscience Import

Date Deposited:

04 Oct 2013 14:59

Last Modified:

05 Dec 2022 14:18

Publisher DOI:

10.1109/TGRS.2007.898089

Web of Science ID:

000247784400024

URI:

https://boris.unibe.ch/id/eprint/25322 (FactScience: 57973)

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