Mätzler, Christian; Rosenkranz, Philip W (2007). Dependence of Microwave Brightness Temperature on Bistatic Scattering: Theoretical Basis. IEEE transactions on geoscience and remote sensing, 45(7), pp. 2130-2138. New York, N.Y.: Institute of Electrical and Electronics Engineers IEEE 10.1109/TGRS.2007.898089
Full text not available from this repository.
Official URL: http://dx.doi.org/10.1109/TGRS.2007.898089
Item Type: |
Journal Article (Original Article) |
|---|---|
Division/Institute: |
08 Faculty of Science > Institute of Applied Physics |
UniBE Contributor: |
Mätzler, Christian |
ISSN: |
0196-2892 |
Publisher: |
Institute of Electrical and Electronics Engineers IEEE |
Language: |
English |
Submitter: |
Factscience Import |
Date Deposited: |
04 Oct 2013 14:59 |
Last Modified: |
05 Dec 2022 14:18 |
Publisher DOI: |
10.1109/TGRS.2007.898089 |
Web of Science ID: |
000247784400024 |
URI: |
https://boris.unibe.ch/id/eprint/25322 (FactScience: 57973) |
Actions (login required)
 |
Edit item |