Yoshida, Koji; Pobelov, Ilya; Mésàros, Gábor; Mishchenko, Artem; Gulcur, Murat; Bryce, Martin R; Wandlowski, Thomas (2012). Electromechanical properties of atomic and molecular junctions measured by conductive atomic force microscopy. In: 28th Annual Meeting of the Swiss Working Group on Surface and Interface Science, Book of Abstracts 37. Fribourg, Switzerland. 27.1.2012.
Item Type: |
Conference or Workshop Item (Abstract) |
|---|---|
Division/Institute: |
08 Faculty of Science > Department of Chemistry, Biochemistry and Pharmaceutical Sciences (DCBP) |
UniBE Contributor: |
Yoshida, Koji, Wandlowski, Thomas |
Subjects: |
500 Science > 570 Life sciences; biology 500 Science > 540 Chemistry |
Language: |
English |
Submitter: |
Andrea Stettler |
Date Deposited: |
15 Nov 2013 08:22 |
Last Modified: |
05 Dec 2022 14:27 |
URI: |
https://boris.unibe.ch/id/eprint/39263 (FactScience: 226099) |
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