Electromechanical properties of atomic and molecular junctions measured by conductive atomic force microscopy

Yoshida, Koji; Pobelov, Ilya; Mésàros, Gábor; Mishchenko, Artem; Gulcur, Murat; Bryce, Martin R; Wandlowski, Thomas (2012). Electromechanical properties of atomic and molecular junctions measured by conductive atomic force microscopy. In: 28th Annual Meeting of the Swiss Working Group on Surface and Interface Science, Book of Abstracts 37. Fribourg, Switzerland. 27.1.2012.

Item Type:

Conference or Workshop Item (Abstract)

Division/Institute:

08 Faculty of Science > Department of Chemistry, Biochemistry and Pharmaceutical Sciences (DCBP)

UniBE Contributor:

Yoshida, Koji, Wandlowski, Thomas

Subjects:

500 Science > 570 Life sciences; biology
500 Science > 540 Chemistry

Language:

English

Submitter:

Andrea Stettler

Date Deposited:

15 Nov 2013 08:22

Last Modified:

05 Dec 2022 14:27

URI:

https://boris.unibe.ch/id/eprint/39263 (FactScience: 226099)

Actions (login required)

Edit item Edit item
Provide Feedback