Atomic Force Microscopy-Scanning Electrochemical Microscopy: Influence of Tip Geometry and Insulation Defects on Diffusion Controlled Currents at Conical Electrodes

Leonhardt, Kelly; Avdic, Amra; Lugstein, Alois; Pobelov, Ilya; Wandlowski, Thomas; Wu, Ming; Gollas, Bernhard; Denuault, Guy (2011). Atomic Force Microscopy-Scanning Electrochemical Microscopy: Influence of Tip Geometry and Insulation Defects on Diffusion Controlled Currents at Conical Electrodes. Analytical chemistry, 83(8), pp. 2971-2977. Washington, D.C.: American Chemical Society 10.1021/ac103083y

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Item Type:

Journal Article (Original Article)

Division/Institute:

08 Faculty of Science > Department of Chemistry, Biochemistry and Pharmaceutical Sciences (DCBP)

UniBE Contributor:

Wandlowski, Thomas

ISSN:

0003-2700

Publisher:

American Chemical Society

Language:

English

Submitter:

Factscience Import

Date Deposited:

04 Oct 2013 14:26

Last Modified:

17 Mar 2015 21:08

Publisher DOI:

10.1021/ac103083y

Web of Science ID:

000289223700020

URI:

https://boris.unibe.ch/id/eprint/9295 (FactScience: 214992)

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