Atomic Force Microscopy-Scanning Electrochemical Microscopy: Influence of Tip Geometry and Insulation Defects on Diffusion Controlled Currents at Conical Electrodes

Leonhardt, Kelly; Avdic, Amra; Lugstein, Alois; Pobelov, Ilya; Wandlowski, Thomas; Wu, Ming; Gollas, Bernhard; Denuault, Guy (2011). Atomic Force Microscopy-Scanning Electrochemical Microscopy: Influence of Tip Geometry and Insulation Defects on Diffusion Controlled Currents at Conical Electrodes. Analytical chemistry, 83(8), pp. 2971-2977. Washington, D.C.: American Chemical Society 10.1021/ac103083y

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Item Type:	Journal Article (Original Article)
Division/Institute:	08 Faculty of Science > Department of Chemistry, Biochemistry and Pharmaceutical Sciences (DCBP)
UniBE Contributor:	Wandlowski, Thomas
ISSN:	0003-2700
Publisher:	American Chemical Society
Language:	English
Submitter:	Factscience Import
Date Deposited:	04 Oct 2013 14:26
Last Modified:	05 Dec 2022 14:07
Publisher DOI:	10.1021/ac103083y
Web of Science ID:	000289223700020
URI:	https://boris.unibe.ch/id/eprint/9295 (FactScience: 214992)