Bohinc, R.; Pamfilidis, G.; Rehault, J.; Radi, P.; Milne, C.; Szlachetko, J.; Bencivenga, F.; Capotondi, F.; Cucini, R.; Foglia, L.; Masciovecchio, C.; Mincigrucci, R.; Pedersoli, E.; Simoncig, A.; Mahne, N.; Cannizzo, A.; Frey, H. M.; Ollmann, Z.; Feurer, T.; Maznev, A. A.; ... (2019). Nonlinear XUV-optical transient grating spectroscopy at the Si L 2,3 –edge. Applied physics letters, 114(18), p. 181101. American Institute of Physics 10.1063/1.5085413
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Item Type: |
Journal Article (Original Article) |
|---|---|
Division/Institute: |
08 Faculty of Science > Institute of Applied Physics 08 Faculty of Science > Institute of Applied Physics > Lasers |
UniBE Contributor: |
Cannizzo, Andrea, Frey, Hans-Martin, Feurer, Thomas |
Subjects: |
600 Technology > 620 Engineering 500 Science 500 Science > 530 Physics |
ISSN: |
0003-6951 |
Publisher: |
American Institute of Physics |
Language: |
English |
Submitter: |
Simone Corry |
Date Deposited: |
09 Jun 2021 15:59 |
Last Modified: |
05 Dec 2022 15:51 |
Publisher DOI: |
10.1063/1.5085413 |
BORIS DOI: |
10.48350/156749 |
URI: |
https://boris.unibe.ch/id/eprint/156749 |
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