Lienemann, Peter; Bleiner, Davide (2012). Elemental analysis with x-ray fluorescence spectrometry. In: Bleiner, Davide (ed.) Short-Wavelength Imaging and Spectroscopy Sources. Proceedings of SPIE: Vol. 8678 (86780D). Bellingham: SPIE 10.1117/12.2010944
Full text not available from this repository.Item Type: |
Conference or Workshop Item (Paper) |
---|---|
Division/Institute: |
08 Faculty of Science > Institute of Applied Physics |
UniBE Contributor: |
Bleiner, Davide |
Series: |
Proceedings of SPIE |
Publisher: |
SPIE |
Language: |
English |
Submitter: |
Factscience Import |
Date Deposited: |
04 Oct 2013 14:43 |
Last Modified: |
05 Dec 2022 14:13 |
Publisher DOI: |
10.1117/12.2010944 |
URI: |
https://boris.unibe.ch/id/eprint/17933 (FactScience: 225770) |