Marin Carbonne, Johanna; Kiss, Andras; Bouvier, Anne-Sophie; Meibom, Anders; Baumgartner, Lukas; Bovay, Thomas; Plane, Florent; Escrig, Stephane; Rubatto, Daniela (2022). Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories. CHIMIA, 76(1-2), p. 26. Schweizerische Chemische Gesellschaft 10.2533/chimia.2022.26
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Item Type: |
Journal Article (Review Article) |
|---|---|
Division/Institute: |
08 Faculty of Science > Institute of Geological Sciences 08 Faculty of Science > Institute of Geological Sciences > Isotope Geology |
UniBE Contributor: |
Rubatto, Daniela |
Subjects: |
500 Science > 550 Earth sciences & geology 500 Science > 540 Chemistry |
ISSN: |
0009-4293 |
Publisher: |
Schweizerische Chemische Gesellschaft |
Language: |
English |
Submitter: |
Daniela Rubatto |
Date Deposited: |
07 Mar 2023 08:15 |
Last Modified: |
04 Sep 2024 17:15 |
Publisher DOI: |
10.2533/chimia.2022.26 |
BORIS DOI: |
10.48350/179578 |
URI: |
https://boris.unibe.ch/id/eprint/179578 |
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