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Kuhn, Adrian; Rompaey, Bart Van; Haensenberger, Lea; Nierstrasz, Oscar Marius; Demeyer, Serge; Gaelli, Markus; Leemput, Koenraad Van (2008). JExample: Exploiting Dependencies Between Tests to Improve Defect Localization. In: Abrahamsson, Pekka; Baskerville, Richard; Conboy, Kieran; Fitzgerald, Brian; Morgan, Lorraine; Wang, Xiaofeng (eds.) Agile Processes in Software Engineering and Extreme Programming. 9th International Conference, XP 2008, Limerick, Ireland, June 10-14, 2008. Proceedings. Lecture Notes in Business Information Processing: Vol. 9 (pp. 73-82). Heidelberg: Springer Verlag 10.1007/978-3-540-68255-4_8
