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Nguyen, Thi Minh Hai; Lechner, David; Stricker, Florian Ulrich; Furrer, Julien; Broekmann, Peter (2015). Combined Secondary Ion Mass Spectrometry Depth Profiling and Focused Ion Beam Analysis of Cu Films Electrodeposited under Oscillatory Conditions. ChemElectroChem, 2(5), pp. 664-671. Wiley 10.1002/celc.201402427
