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Yoshida, Koji; Pobelov, Ilya; Mésàros, Gábor; Mishchenko, Artem; Gulcur, Murat; Bryce, Martin R; Wandlowski, Thomas (2012). Electromechanical properties of atomic and molecular junctions measured by conductive atomic force microscopy. In: 28th Annual Meeting of the Swiss Working Group on Surface and Interface Science, Book of Abstracts 37. Fribourg, Switzerland. 27.1.2012.
