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Parisi, Ludovica; Toffoli, Andrea; Ghezzi, Benedetta; Lagonegro, Paola; Trevisi, Giovanna; Macaluso, Guido M (2022). Preparation of hybrid samples for scanning electron microscopy (SEM) coupled to focused ion beam (FIB) analysis: A new way to study cell adhesion to titanium implant surfaces. PLoS ONE, 17(8), e0272486. Public Library of Science 10.1371/journal.pone.0272486
