https://orcid.org/0000-0002-0786-3402

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2019

Bohinc, R.; Pamfilidis, G.; Rehault, J.; Radi, P.; Milne, C.; Szlachetko, J.; Bencivenga, F.; Capotondi, F.; Cucini, R.; Foglia, L.; Masciovecchio, C.; Mincigrucci, R.; Pedersoli, E.; Simoncig, A.; Mahne, N.; Cannizzo, A.; Frey, H. M.; Ollmann, Z.; Feurer, T.; Maznev, A. A.; ... (2019). Nonlinear XUV-optical transient grating spectroscopy at the Si L 2,3 –edge. Applied physics letters, 114(18), p. 181101. American Institute of Physics 10.1063/1.5085413

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